PAYTON, R. L.; CHIARELLA, D.; KINGDON, A. An introduction for non-experts on using X-ray micro computed tomography as a tool for pore scale digital subsurface characterisation of siliciclastic materials. Sedimentologika, [S. l.], v. 2, n. 2, 2024. DOI: 10.57035/journals/sdk.2024.e22.1367. Disponível em: https://oap.unige.ch/journals/sdk/article/view/1367. Acesso em: 21 nov. 2024.